This image of ragweed pollen was taken with Hitachi’s SU5000 Variable Pressure Scanning Electron Microscope (VP-SEM) at the Clemson University Electron Microscopy Facility. The microscope allows for samples to be analyzed over longer durations and comes with a large chamber that is useful for irregularly shaped specimens that couldn’t be imaged elsewhere. This is one of four advanced microscopes newly added to the facility.

To learn more about the Clemson University Electron Microscopy Facility, visit here.